| 1. Theoretical Aspects |
| 2. Instrumentation |
| 3. Using Optical Parameters to Determine Material Properties |
| 4. Determining Optical Parameters for Inaccessible Substrates and Unknown Films |
| 5. Extremely Thin Films |
| 6. The Special Case of Polysilicon |
| 7. The Effect of Roughness |
| Case Studies |
| Case 1. Dissolution and Swelling of Thin Polymer Films |
| Case 2. Ion Beam Interaction with Silicon |
| Case 3. Dry Oxidation of Metals |
| Case 4. Optical Properties of Sputtered Chromium Suboxide Thin Films |
| Case 5. Ion-assisted Film Growth of Zirconium Dioxide |
| Case 6. Electrochemical/Ellipsometric Studies of Oxides on Metals |
| Case 7. Amorphous Hydrogenated Carbon Films |
| Case 8. Fluoropolymer Films on Silicon from Reactive Ion Etching |
| Case 9. Various Films on InP |
| Case 10. Benzotriazole and Benzimidazole on Copper |
| Case 11. Gas Adsorption on Metal Surfaces |
| Case 12. Silicon-Germanium Thin Films |
| Case 13. Profiling of HgCdTe |
| Case 14. Oxides and Nitrides of Silicon |
| Appendices |